National Center for Electron Microscopy in Beijing

The National Center for Electron Microscopy in Beijing, one of the National Science and Technology Infrastructures, was established in 2006, with fundings from the Ministry of Science and Technology of China, the Ministry of Education of China and Beijing Municipal Science and Technology Commission. The center is an open, innovational and high-level national scientific research infrastructure.

The guiding principles of the Center are:
Based on high-level scientific research, offering high-quality technical service, operating equipments with high-efficiency, and promoting the resource sharing of equipments and knowledge.
Providing with excellent technical support to solve technology issues in the development of national economy and national defense.

The aims of the Center are:
A world-recognized electron microscopy laboratory with high-level scientific achievements;
A research and communication center for advanced methodology and new technology in electron microscopy;
A training center for excellent professionals in electron microscopy;
An excellent communication platform for sharing the electron microscopy and the related facilities, professionals and knowledge;
An important base for promoting the development of science & technology and the economics in China.

The major instruments in the Center include double-aberration-corrected FEI Titan Cubed Themis G2 300 , the first aberration-corrected transmission electron microscope in China FEI Titan 80-300 Cs corrector TEM, JEOL 2010F Field Emission TEM, FEI Tecnai G2 20 TEM, JEOL 2100 TEM, JEOL 2011 TEM, Zeiss Merlin FEG SEM, Zeiss Auriga series Modular CrossBeam workstation, Hitachi S-5500 FEG SEM, and JEOL 6301F FEG SEM, Atomic Force Scanning Tunneling Microscope, two sets of Laser Pulse Deposition (PLD) platforms.

The academic areas of the Center mainly focuses on:
Investigation on the structure-property relationship of the advanced materials necessary for our economy and national defense
Frontier research on theories and methodologies in electron microscopy
Promoting the R&D ability for key technologies for electron microscope and its attachments, in cooperation with domestic electron microscope manufacturers.

1. Microstructures and properties of materials
Polarization and interfacial coupling effects in ferroelectrics, (anti)ferromagnetics, and multiferroics
Structures and surface phenomena of metal catalysts and metal oxides
Modulating microstructures, properties and applications of engineering alloy
Spintronic materials preparation, properties and microstructures
2. Electron Microscopy of Materials
Aberration corrected high resolution transmission electron microscopy
High spatial resolution analytical transmission electron microscopy
In-situ transmission electron microscopy
3. Computational materials science (cms)
4. Development of the electronic microscope accessories

The related papers are published in the high level academic journals including Nature Comm.,Phys. Rev. Lett., J. Am. Chem. Soc., Angew. Chem., Adv. Mater., Acta Mater..

The Center includes the headquarter in Tsinghua University and two branches in National Center for Nanoscience and Technology and Beijing University of Technology.
The administration committee of the Center: Vice President of the Tsinghua University Mr. Cheng Jianping (Director), Prof. Heqiang Ye, Prof. Jian Xu, Prof. Xiaofeng Wu, Prof. Shuning Zhen, Prof. Jingfeng Li, Prof. Jianhua Zhao, Prof. Rong Yu,
The technical committee of the Center: Prof. Ye Hengqiang (Director), Prof.Jing Zhu (Vice Director), Prof. Fanghua Li, Prof. Junen Yao, Prof. Ze Zhang, Prof. Xiaodong Han, Prof. Chunlin Jia, Prof. Lianmao Peng, Prof. Jianghua Chen, Prof. Yongming Chen, Prof. Rong Yu..
Director of the Center: Prof. Rong Yu
The user commitee of the Center: Prof. Jianhua Zhao (Director), Prof. Yadong Li, Prof. Kui Du, Prof. Zhiyou Zhou, Prof. Xiaojing Leng, Prof. Xiaomin Ren, Prof. Yi Luo.